Abstract
A recently developed approach for pattern recognition using spatial filters with reduced tolerance requirements is employed for the generation of filters containing mainly phase information. As anticipated, the recognition levels were decreased, but they remain adequate for unambiguous identification together with appreciable amounts of distortion immunity. Furthermore, the information content of the filters is compatible with low resolution devices like spatial light modulators.
| Original language | English |
|---|---|
| Pages (from-to) | 2315-2319 |
| Number of pages | 5 |
| Journal | Applied Optics |
| Volume | 26 |
| Issue number | 12 |
| DOIs | |
| State | Published - 15 Jun 1987 |
| Externally published | Yes |
ASJC Scopus subject areas
- Atomic and Molecular Physics, and Optics
- Engineering (miscellaneous)
- Electrical and Electronic Engineering