@inproceedings{d2a48800153448ae904ddd344784d930,
title = "Do inspections really help?",
abstract = "{"}The potentially dire consequences of not detecting an electrical fault early during the process have motivated technology managers in the semiconductor industry to introduce an inspection step after about every ten process steps.{"}[1] Researchers added that {"}if new inspection operations are added, the delay to get this measurement result is reduced, and the wafer at risk could thus also be reduced.{"}[2] Inspections, however, like processes, are imperfect and prone to errors, which have devastating effects. Despite their significance, these effects are rather unnoticed. It turns out that when processes are in-control and perform reasonably well, the consequent costs of inspections may exceed the saving, as demonstrated in this presentation.",
keywords = "Hidden plant, Inspection errors, Quality costs",
author = "{Eben Chaime}, Moshe",
note = "Publisher Copyright: {\textcopyright} 2016 The authors and IOS Press. All rights reserved.; 14th International Conference on Manufacturing Research, ICMR 2016 ; Conference date: 06-09-2016 Through 08-09-2016",
year = "2016",
month = jan,
day = "1",
doi = "10.3233/978-1-61499-668-2-503",
language = "English",
series = "Advances in Transdisciplinary Engineering",
publisher = "IOS Press BV",
pages = "503--507",
editor = "Goh, {Yee Mey} and Keith Case",
booktitle = "Advances in Manufacturing Technology XXX - Proceedings of the 14th International Conference on Manufacturing Research, ICMR2016 - Incorporating the 31st National Conference on Manufacturing Research",
address = "Netherlands",
}