Abstract
Final product inspection of a multi-attribute product, such as in the electronic assembly industry, involves expensive facilities. The correlation among attributes may be used for reducing the efforts needed for screening the products; however, engineers without an appropriate statistical-economical analysis tools do not take risks, and they designate full inspection of each item. We propose a double stage inspection program for reducing inspection efforts. Assuming that the joint distribution is known, the conditional probability that a product is “good” may be evaluated conditional upon the observation of the product's first-stage inspected quality attributes. Then, an expected cost minimization is implemented in order to decide whether a second inspection stage is required or a classification should be based solely on the first inspection stage. The cost factors include inspection and false classification. The method is illustrated on a real data set from a particular electronic product of Motorola-Arad Ltd.
Original language | English |
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Pages (from-to) | 1057-1061 |
Number of pages | 5 |
Journal | IIE Transactions (Institute of Industrial Engineers) |
Volume | 29 |
Issue number | 12 |
DOIs | |
State | Published - 1 Jan 1997 |
ASJC Scopus subject areas
- Industrial and Manufacturing Engineering