Abstract
Dual Response Surface Methodology is a powerful tool for simultaneously optimizing the mean and the variance of a quality characteristic in the field of quality engineering. The optimization of dual response systems to achieve better quality has played a major role in the design of industrial products and processes. In this paper we suggest using a process capability index - Cpk - as the objective function. We show by ways of multiple examples that this method improves the obtained yield of a process for different response variable types.
Original language | English |
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Pages (from-to) | 7006-7020 |
Number of pages | 15 |
Journal | Communications in Statistics - Theory and Methods |
Volume | 51 |
Issue number | 20 |
DOIs | |
State | Published - 1 Jan 2022 |
Keywords
- Yield maximization
- process capability index
- process improvement
- robust design
ASJC Scopus subject areas
- Statistics and Probability