Abstract
Dynamical scaling analysis is theoretically performed for the ac (optical) Hall conductivity σxy (εF, ω) as a function of Fermi energy εF and frequency ω for the two-dimensional electron gas and for graphene. In both systems, results based on exact diagonalization show that σxy (εF, ω) displays a well-defined dynamical scaling, for which the dynamical critical exponent as well as the localization exponent are obtained. A crossover from the dc-like behavior to the ac regime is identified. The dynamical scaling analysis has enabled us to quantify the plateau in the ac Hall conductivity previously obtained and to predict that the plateaux structure in ac is robust enough to be observed in the terahertz regime.
Original language | English |
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Article number | 081404 |
Journal | Physical Review B - Condensed Matter and Materials Physics |
Volume | 82 |
Issue number | 8 |
DOIs | |
State | Published - 9 Aug 2010 |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics