TY - GEN
T1 - DynOR
T2 - 42nd European Solid-State Circuits Conference, ESSCIRC 2016
AU - Constantin, Jeremy
AU - Bonetti, Andrea
AU - Teman, Adam
AU - Müller, Christoph
AU - Schmid, Lorenz
AU - Burg, Andreas
N1 - Publisher Copyright:
© 2016 IEEE.
PY - 2016/10/18
Y1 - 2016/10/18
N2 - This paper presents DynOR, a 32-bit 6-stage Open-RISC microprocessor with dynamic clock adjustment. To alleviate the issue of unused dynamic timing margins, the clock period of the processor is adjusted on a cycle-by-cycle level, based on the instruction types currently in flight in the pipeline. To this end, we employ a custom designed clock generation unit, capable of immediate glitch-free adjustments of the clock period over a wide range with fine granularity. Our chip measurements in 28nm FD-SOI technology show that DynOR provides an average speedup of 19% in program execution over a wide range of operating conditions, with a peak speedup for certain applications of up to 41%. Furthermore, this speedup can be traded off against energy, to reduce the chip power consumption for a typical die by up to 15%, compared to a static clocking scheme based on worst case excitation.
AB - This paper presents DynOR, a 32-bit 6-stage Open-RISC microprocessor with dynamic clock adjustment. To alleviate the issue of unused dynamic timing margins, the clock period of the processor is adjusted on a cycle-by-cycle level, based on the instruction types currently in flight in the pipeline. To this end, we employ a custom designed clock generation unit, capable of immediate glitch-free adjustments of the clock period over a wide range with fine granularity. Our chip measurements in 28nm FD-SOI technology show that DynOR provides an average speedup of 19% in program execution over a wide range of operating conditions, with a peak speedup for certain applications of up to 41%. Furthermore, this speedup can be traded off against energy, to reduce the chip power consumption for a typical die by up to 15%, compared to a static clocking scheme based on worst case excitation.
UR - https://www.scopus.com/pages/publications/84994403533
U2 - 10.1109/ESSCIRC.2016.7598292
DO - 10.1109/ESSCIRC.2016.7598292
M3 - Conference contribution
AN - SCOPUS:84994403533
T3 - European Solid-State Circuits Conference
SP - 261
EP - 264
BT - ESSCIRC 2016
PB - Institute of Electrical and Electronics Engineers
Y2 - 12 September 2016 through 15 September 2016
ER -