@inproceedings{d897c384cfdf4f8f9c9a2c0958257075,
title = "Electron microscopy in polyethylene films research",
abstract = "In the present study morphology of different polyethylene films was shown. The morphology investigation of biaxially oriented linear low density (LLDPE) was investigated by transmission electron microscopy (TEM). The fibrillation of the crystalline phase during biaxial orientation was presented. The influence of crosslinking on polymer crystallization was presented as well. We emphasized that the scanning electron microscopy (SEM) can give sometimes inadequate results if it is used for morphology studies. Atomic forced microscopy (AFM) was shown to be an useful tool studying surface roughness of the blown and cast films.",
keywords = "AFM, Biaxial orientation, Morphology, SEM, TEM",
author = "A. Bobovitch and Y. Nir and Michler, {G. H.} and S. Henning and A. Ajji and Y. Unigovski and Gutman, {E. M.}",
year = "2007",
month = oct,
day = "2",
language = "English",
isbn = "1604232145",
series = "Annual Technical Conference - ANTEC, Conference Proceedings",
pages = "1508--1512",
booktitle = "Society of Plastics Engineers Annual Technical Conference",
note = "Society of Plastics Engineers Annual Technical Conference: Plastics Encounter at ANTEC 2007 ; Conference date: 06-05-2007 Through 11-05-2007",
}