Electron microscopy in polyethylene films research

A. Bobovitch, Y. Nir, G. H. Michler, S. Henning, A. Ajji, Y. Unigovski, E. M. Gutman

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

In the present study morphology of different polyethylene films was shown. The morphology investigation of biaxially oriented linear low density (LLDPE) was investigated by transmission electron microscopy (TEM). The fibrillation of the crystalline phase during biaxial orientation was presented. The influence of crosslinking on polymer crystallization was presented as well. We emphasized that the scanning electron microscopy (SEM) can give sometimes inadequate results if it is used for morphology studies. Atomic forced microscopy (AFM) was shown to be an useful tool studying surface roughness of the blown and cast films.

Original languageEnglish
Title of host publicationSociety of Plastics Engineers Annual Technical Conference
Subtitle of host publicationPlastics Encounter at ANTEC 2007, Conference Proceedings
Pages1508-1512
Number of pages5
StatePublished - 2 Oct 2007
EventSociety of Plastics Engineers Annual Technical Conference: Plastics Encounter at ANTEC 2007 - Cincinnati, OH, United States
Duration: 6 May 200711 May 2007

Publication series

NameAnnual Technical Conference - ANTEC, Conference Proceedings
Volume3

Conference

ConferenceSociety of Plastics Engineers Annual Technical Conference: Plastics Encounter at ANTEC 2007
Country/TerritoryUnited States
CityCincinnati, OH
Period6/05/0711/05/07

Keywords

  • AFM
  • Biaxial orientation
  • Morphology
  • SEM
  • TEM

Fingerprint

Dive into the research topics of 'Electron microscopy in polyethylene films research'. Together they form a unique fingerprint.

Cite this