Electronic and transport properties of reduced and oxidized nanocrystalline TiO2 films

A. Rothschild; Y. Komem; A. Levakov; N. Ashkenasy; Yoram Shapira

doi:10.1063/1.1539556

Electronic and transport properties of reduced and oxidized nanocrystalline TiO₂ films

A. Rothschild, Y. Komem, A. Levakov, N. Ashkenasy, Yoram Shapira

Research output: Contribution to journal › Article › peer-review

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Abstract

An investigation on the electronic properties of reduced and oxidized TiO₂ films was presented. The in situ conductivity, current-voltage measurements as a function of the ambient oxygen pressure and temperature and ex situ surface photovoltage spectroscopy techniques were used for the purpose. Results showed that the films were conductive in the reduced state.

Original language	English
Pages (from-to)	574-576
Number of pages	3
Journal	Applied Physics Letters
Volume	82
Issue number	4
DOIs	https://doi.org/10.1063/1.1539556
State	Published - 27 Jan 2003
Externally published	Yes

ASJC Scopus subject areas

Physics and Astronomy (miscellaneous)

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title = "Electronic and transport properties of reduced and oxidized nanocrystalline TiO2 films",

abstract = "An investigation on the electronic properties of reduced and oxidized TiO2 films was presented. The in situ conductivity, current-voltage measurements as a function of the ambient oxygen pressure and temperature and ex situ surface photovoltage spectroscopy techniques were used for the purpose. Results showed that the films were conductive in the reduced state.",

author = "A. Rothschild and Y. Komem and A. Levakov and N. Ashkenasy and Yoram Shapira",

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T1 - Electronic and transport properties of reduced and oxidized nanocrystalline TiO2 films

AU - Rothschild, A.

AU - Komem, Y.

AU - Levakov, A.

AU - Ashkenasy, N.

AU - Shapira, Yoram

PY - 2003/1/27

Y1 - 2003/1/27

N2 - An investigation on the electronic properties of reduced and oxidized TiO2 films was presented. The in situ conductivity, current-voltage measurements as a function of the ambient oxygen pressure and temperature and ex situ surface photovoltage spectroscopy techniques were used for the purpose. Results showed that the films were conductive in the reduced state.

AB - An investigation on the electronic properties of reduced and oxidized TiO2 films was presented. The in situ conductivity, current-voltage measurements as a function of the ambient oxygen pressure and temperature and ex situ surface photovoltage spectroscopy techniques were used for the purpose. Results showed that the films were conductive in the reduced state.

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U2 - 10.1063/1.1539556

DO - 10.1063/1.1539556

M3 - Article

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VL - 82

SP - 574

EP - 576

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 4

ER -

Electronic and transport properties of reduced and oxidized nanocrystalline TiO₂ films

Abstract

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