Electronic component solderability assessment algorithm by deep external visual inspection

Eyal Weiss

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

9 Scopus citations

Abstract

Electronic component solderability is an essential capability in electronics manufacturing. It determines an electronic component's ability to be reliably and repeatably soldered onto a circuit board in an automated production scheme. However, conventional solderability assessment is a destructive test that is performed on samples only. A novel, automatic, and non-destructive method for assessing the solderability of electronic leads based on deep visual inspection (DVI) is presented. The solderability is correlated to the surface reflectance which is degrading by corrosion and intermetallic reactions. The inspected components' solderability is assessed by acquiring micro-features in images through a combined supervised and unsupervised machine learning system. The former is designed to evaluate the homogeneity of the leads and the latter is designed for assessing soldering leads by classifying them into leads with good and poor solderability, based on their apparent-age. The models are trained using multiple images of a variety of soldering leads from different ages and therefore different solderability conditions. The experimental results show that components from the same package do not have homogenous solderability. Furthermore, while the leads mostly fit their apparent-age, some have solderability corresponding to apparent-older components. This method allows for continuous real-time 100% component screening, with very high classification accuracy. The presented method paves the way for a radical improvement in manufacturing quality by assuring that only components with good solderability are used during assembly.

Original languageEnglish
Title of host publicationProceedings of the 2020 IEEE International Conference on Physical Assurance and Inspection on Electronics, PAINE 2020
PublisherInstitute of Electrical and Electronics Engineers
ISBN (Electronic)9781728161211
DOIs
StatePublished - 15 Dec 2020
Externally publishedYes
Event2020 IEEE International Conference on Physical Assurance and Inspection on Electronics, PAINE 2020 - Virtual, Washington, United States
Duration: 15 Dec 202016 Dec 2020

Publication series

NameProceedings of the 2020 IEEE International Conference on Physical Assurance and Inspection on Electronics, PAINE 2020

Conference

Conference2020 IEEE International Conference on Physical Assurance and Inspection on Electronics, PAINE 2020
Country/TerritoryUnited States
CityVirtual, Washington
Period15/12/2016/12/20

Keywords

  • Electronic component
  • machine learning
  • quality
  • solderability

ASJC Scopus subject areas

  • Hardware and Architecture
  • Electrical and Electronic Engineering
  • Safety, Risk, Reliability and Quality

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