Abstract
Electronic component solderability is an essential capability in electronics manufacturing. It determines an electronic component's ability to be reliably and repeatably soldered onto a circuit board in an automated production scheme. However, conventional solderability assessment is a destructive test that is performed on samples only. A novel, automatic, and non-destructive method for assessing the solderability of electronic leads based on deep visual inspection (DVI) is presented. The solderability is correlated to the surface reflectance which is degrading by corrosion and intermetallic reactions. The inspected components' solderability is assessed by acquiring micro-features in images through a combined supervised and unsupervised machine learning system. The former is designed to evaluate the homogeneity of the leads and the latter is designed for assessing soldering leads by classifying them into leads with good and poor solderability, based on their apparent-age. The models are trained using multiple images of a variety of soldering leads from different ages and therefore different solderability conditions. The experimental results show that components from the same package do not have homogenous solderability. Furthermore, while the leads mostly fit their apparent-age, some have solderability corresponding to apparent-older components. This method allows for continuous real-time 100% component screening, with very high classification accuracy. The presented method paves the way for a radical improvement in manufacturing quality by assuring that only components with good solderability are used during assembly.
| Original language | English |
|---|---|
| Title of host publication | Proceedings of the 2020 IEEE International Conference on Physical Assurance and Inspection on Electronics, PAINE 2020 |
| Publisher | Institute of Electrical and Electronics Engineers |
| ISBN (Electronic) | 9781728161211 |
| DOIs | |
| State | Published - 15 Dec 2020 |
| Externally published | Yes |
| Event | 2020 IEEE International Conference on Physical Assurance and Inspection on Electronics, PAINE 2020 - Virtual, Washington, United States Duration: 15 Dec 2020 → 16 Dec 2020 |
Publication series
| Name | Proceedings of the 2020 IEEE International Conference on Physical Assurance and Inspection on Electronics, PAINE 2020 |
|---|
Conference
| Conference | 2020 IEEE International Conference on Physical Assurance and Inspection on Electronics, PAINE 2020 |
|---|---|
| Country/Territory | United States |
| City | Virtual, Washington |
| Period | 15/12/20 → 16/12/20 |
UN SDGs
This output contributes to the following UN Sustainable Development Goals (SDGs)
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SDG 9 Industry, Innovation, and Infrastructure
Keywords
- Electronic component
- machine learning
- quality
- solderability
ASJC Scopus subject areas
- Hardware and Architecture
- Electrical and Electronic Engineering
- Safety, Risk, Reliability and Quality
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