Abstract
Attenuated total reflectance (ATR) and X-ray photoelectron spectroscopy in suite with Kelvin probe were conjugated to explore the electronic properties of Si-Hx vibrational modes by developing Si waveguide with large dynamic detection range compared with conventional IR. The Si 2p emission and work-function related to the formation and elimination of Si-Hx bonds at Si surfaces are monitored based on the detection of vibrational mode frequencies. A transition between various Si-Hx bonds and thus related vibrational modes is monitored for which effective momentum transfer could be demonstrated. The combination of the aforementioned methods provides for results that permit a model for the kinetics of hydrogen termination of Si surfaces with time and advanced surface characterizing of hybrid-terminated semiconducting solids.
Original language | English |
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Pages (from-to) | 3988-3993 |
Number of pages | 6 |
Journal | Journal of Physical Chemistry Letters |
Volume | 6 |
Issue number | 19 |
DOIs | |
State | Published - 22 Sep 2015 |
Externally published | Yes |
Keywords
- ATR
- Si waveguide
- Si-H vibrational modes
- XPS
- work-function
ASJC Scopus subject areas
- General Materials Science
- Physical and Theoretical Chemistry