Electronic surface properties of semiconductor surfaces and interfaces

Keyphrases

• Surface Properties 100%
• Scanning Kelvin Probe Force Microscopy (SKPFM) 100%
• Semiconductor Surface 100%
• Semiconductor Interfaces 100%
• Work Function 66%
• Work-as-done 66%
• Electro-optic 33%
• Electronic Properties 33%
• Functional Potential 33%
• Device Performance 33%
• Surface States 33%
• Optoelectronic Properties 33%
• Physical Size 33%
• Interface Properties 33%
• Semiconductor Devices 33%
• Nanometer Resolution 33%
• Electrostatic Potential Distribution 33%
• Work Function Variation 33%
• Organic Semiconductors 33%
• Inorganic Semiconductor 33%

Material Science

• Electronic Property 100%
• Electronic Property of Interfaces 100%
• Interface Property 50%
• Semiconductor Device 50%
• Surface Property 50%