Engineering helimagnetism in MnSi thin films

S. L. Zhang, R. Chalasani, A. A. Baker, N. J. Steinke, A. I. Figueroa, A. Kohn, G. Van Der Laan, T. Hesjedal

Research output: Contribution to journalArticlepeer-review

6 Scopus citations

Abstract

Magnetic skyrmion materials have the great advantage of a robust topological magnetic structure, which makes them stable against the superparamagnetic effect and therefore a candidate for the next-generation of spintronic memory devices. Bulk MnSi, with an ordering temperature of 29.5 K, is a typical skyrmion system with a propagation vector periodicity of ∼18 nm. One crucial prerequisite for any kind of application, however, is the observation and precise control of skyrmions in thin films at room-temperature. Strain in epitaxial MnSi thin films is known to raise the transition temperature to 43 K. Here we show, using magnetometry and x-ray spectroscopy, that the transition temperature can be raised further through proximity coupling to a ferromagnetic layer. Similarly, the external field required to stabilize the helimagnetic phase is lowered. Transmission electron microscopy with element-sensitive detection is used to explore the structural origin of ferromagnetism in these Mn-doped substrates. Our work suggests that an artificial pinning layer, not limited to the MnSi/Si system, may enable room temperature, zero-field skyrmion thin-film systems, thereby opening the door to device applications.

Original languageEnglish
Article number015217
JournalAIP Advances
Volume6
Issue number1
DOIs
StatePublished - 1 Jan 2016
Externally publishedYes

ASJC Scopus subject areas

  • Physics and Astronomy (all)

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