Enhanced counterion localization induced by surface charge modulation

D. B. Lukatsky, S. A. Safran, A. W.C. Lau, P. Pincus

Research output: Contribution to journalArticlepeer-review

45 Scopus citations

Abstract

Using both small-amplitude and singular-perturbation theories we predict theoretically that the presence of surface charge modulations gives rise to an enhancement of the counterion density near the surface above and beyond that of a uniform, charged surface. We confirm these predictions with Monte Carlo simulations. Our study focuses on the weak-to moderate-coupling regime which is complementary to a similar investigation performed by Moreira and Netz (Europhys. Lett., 57 (2002) 911) in the strong-coupling case.

Original languageEnglish
Pages (from-to)785-791
Number of pages7
JournalEurophysics Letters
Volume58
Issue number5
DOIs
StatePublished - 19 Aug 2002
Externally publishedYes

Fingerprint

Dive into the research topics of 'Enhanced counterion localization induced by surface charge modulation'. Together they form a unique fingerprint.

Cite this