Erratum: (Nonlinear Materials - Growth, Characterization, Devices, and Applications (21 Jan 2002))

Research output: Contribution to journal › Comment/debate

Original language	English
Pages (from-to)	78-79
Number of pages	2
Journal	Proceedings of SPIE - The International Society for Optical Engineering
Volume	4628
State	Published - 1 Jan 2002
Event	Nonlinear Materials: Growth, Characterization, Devices, and Applications - San Jose, CA, United States Duration: 21 Jan 2002 → 21 Jan 2002

ASJC Scopus subject areas

@article{6e632c798e234268a798c0cdbbae1cac,

title = "Erratum: (Nonlinear Materials - Growth, Characterization, Devices, and Applications (21 Jan 2002))",

author = "Lowenthal, \{Dennis D.\} and Kalisky, \{Yehoshua Y.\}",

year = "2002",

month = jan,

day = "1",

language = "English",

volume = "4628",

pages = "78--79",

journal = "Proceedings of SPIE - The International Society for Optical Engineering",

issn = "0277-786X",

publisher = "SPIE",

note = "Nonlinear Materials: Growth, Characterization, Devices, and Applications ; Conference date: 21-01-2002 Through 21-01-2002",

}

TY - JOUR

T1 - Erratum

T2 - Nonlinear Materials: Growth, Characterization, Devices, and Applications

AU - Lowenthal, Dennis D.

AU - Kalisky, Yehoshua Y.

PY - 2002/1/1

Y1 - 2002/1/1

UR - https://www.scopus.com/pages/publications/0036405221

M3 - Comment/debate

AN - SCOPUS:0036405221

SN - 0277-786X

VL - 4628

SP - 78

EP - 79

JO - Proceedings of SPIE - The International Society for Optical Engineering

JF - Proceedings of SPIE - The International Society for Optical Engineering

Y2 - 21 January 2002 through 21 January 2002

ER -