Abstract
This article examines Mflops as a measure of performance and attempts to establish a consistent model for evaluating and validating computer performance with the Mflops index. The Mflops index is very sensitive to the application it measures. Results can vary by an order of magnitude when the problem size is changed a different application type is executed or otherwise the parameters are changed. Analysis reveals a high correlation between the Mflops and MIPS measures for various manufacturers and time periods. Various models tried, based on specific computer parameters, accurately predicted the Mflops results.
Original language | English |
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Pages (from-to) | 69-75 |
Number of pages | 7 |
Journal | Journal of Electroanalytical Chemistry |
Volume | 401 |
Issue number | 1-2 |
State | Published - 1 Jan 1996 |
ASJC Scopus subject areas
- Analytical Chemistry
- General Chemical Engineering
- Electrochemistry