Experimental correction of the axial shielding equation

E. Paperno, I. Sasada, K. Tashiro

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Analytical descriptions of axial shielding for cylindrical shields (neglecting the effect of the openings or caps) is based on the assumption that the field reduction inside the shield is due to the demagnetizing field within the equivalent ellipsoid: Sax = 1 + Nell μav = 1 + 4 Nell μt/D (equation 1), where Sax is the axial shielding factor, Nell is the demagnetizing factor of the equivalent ellipsoid, μav is the average permeability of the shield (the permeability that is averaged over the shield's cross-sectional area, μav = 4μt/D), μ is the permeability and t/D is the thickness-to-diameter ratio of the shield. Equation (1) shows some discrepancy; it seems more reasonable to replace the Nell in (1) by the demagnetizing factor of the equivalent rod, Nrod, because the shields analyzed have the same outer surface as the rod does. In order to support the above idea experimentally, we built and investigated ten cylindrical shields with L/D ratios from 1 to 8.3. The results obtained show that the employment of the Nrod in (1) provides much better agreement between the experimental and analytical results.

Original languageEnglish
Title of host publicationINTERMAG Europe 2002 - IEEE International Magnetics Conference
EditorsJ. Fidler, B. Hillebrands, C. Ross, D. Weller, L. Folks, E. Hill, M. Vazquez Villalabeitia, J. A. Bain, Jo De Boeck, R. Wood
PublisherInstitute of Electrical and Electronics Engineers
ISBN (Electronic)0780373650, 9780780373655
DOIs
StatePublished - 1 Jan 2002
Event2002 IEEE International Magnetics Conference, INTERMAG Europe 2002 - Amsterdam, Netherlands
Duration: 28 Apr 20022 May 2002

Publication series

NameINTERMAG Europe 2002 - IEEE International Magnetics Conference

Conference

Conference2002 IEEE International Magnetics Conference, INTERMAG Europe 2002
Country/TerritoryNetherlands
CityAmsterdam
Period28/04/022/05/02

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering
  • Surfaces, Coatings and Films

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