Extending the Depth of Focus of an Infrared Microscope Using a Binary Axicon Fabricated on Barium Fluoride

Molong Han; Daniel Smith; Tauno Kahro; Dominyka Stonytė; Aarne Kasikov; Darius Gailevičius; Vipin Tiwari; Agnes Pristy Ignatius Xavier; Shivasubramanian Gopinath; Soon Hock Ng; Aravind Simon John Francis Rajeswary; Aile Tamm; Kaupo Kukli; Keith Bambery; Jitraporn Vongsvivut; Saulius Juodkazis; Vijayakumar Anand

doi:10.3390/mi15040537

Extending the Depth of Focus of an Infrared Microscope Using a Binary Axicon Fabricated on Barium Fluoride

Molong Han, Daniel Smith, Tauno Kahro, Dominyka Stonytė, Aarne Kasikov, Darius Gailevičius, Vipin Tiwari, Agnes Pristy Ignatius Xavier, Shivasubramanian Gopinath, Soon Hock Ng, Aravind Simon John Francis Rajeswary, Aile Tamm, Kaupo Kukli, Keith Bambery, Jitraporn Vongsvivut, Saulius Juodkazis, Vijayakumar Anand

Research output: Contribution to journal › Article › peer-review

1 Scopus citations

Abstract

Axial resolution is one of the most important characteristics of a microscope. In all microscopes, a high axial resolution is desired in order to discriminate information efficiently along the longitudinal direction. However, when studying thick samples that do not contain laterally overlapping information, a low axial resolution is desirable, as information from multiple planes can be recorded simultaneously from a single camera shot instead of plane-by-plane mechanical refocusing. In this study, we increased the focal depth of an infrared microscope non-invasively by introducing a binary axicon fabricated on a barium fluoride substrate close to the sample. Preliminary results of imaging the thick and sparse silk fibers showed an improved focal depth with a slight decrease in lateral resolution and an increase in background noise.

Original language	English
Article number	537
Journal	Micromachines
Volume	15
Issue number	4
DOIs	https://doi.org/10.3390/mi15040537
State	Published - 1 Apr 2024
Externally published	Yes

Keywords

axial resolution
binary axicon
chemical imaging
femtosecond ablation
infrared microscopy
photolithography

ASJC Scopus subject areas

Control and Systems Engineering
Mechanical Engineering
Electrical and Electronic Engineering

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10.3390/mi15040537

Cite this

Han, M., Smith, D., Kahro, T., Stonytė, D., Kasikov, A., Gailevičius, D., Tiwari, V., Ignatius Xavier, A. P., Gopinath, S., Ng, S. H., John Francis Rajeswary, A. S., Tamm, A., Kukli, K., Bambery, K., Vongsvivut, J., Juodkazis, S., & Anand, V. (2024). Extending the Depth of Focus of an Infrared Microscope Using a Binary Axicon Fabricated on Barium Fluoride. Micromachines, 15(4), Article 537. https://doi.org/10.3390/mi15040537

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title = "Extending the Depth of Focus of an Infrared Microscope Using a Binary Axicon Fabricated on Barium Fluoride",

abstract = "Axial resolution is one of the most important characteristics of a microscope. In all microscopes, a high axial resolution is desired in order to discriminate information efficiently along the longitudinal direction. However, when studying thick samples that do not contain laterally overlapping information, a low axial resolution is desirable, as information from multiple planes can be recorded simultaneously from a single camera shot instead of plane-by-plane mechanical refocusing. In this study, we increased the focal depth of an infrared microscope non-invasively by introducing a binary axicon fabricated on a barium fluoride substrate close to the sample. Preliminary results of imaging the thick and sparse silk fibers showed an improved focal depth with a slight decrease in lateral resolution and an increase in background noise.",

keywords = "axial resolution, binary axicon, chemical imaging, femtosecond ablation, infrared microscopy, photolithography",

author = "Molong Han and Daniel Smith and Tauno Kahro and Dominyka Stonytė and Aarne Kasikov and Darius Gailevi{\v c}ius and Vipin Tiwari and {Ignatius Xavier}, {Agnes Pristy} and Shivasubramanian Gopinath and Ng, {Soon Hock} and {John Francis Rajeswary}, {Aravind Simon} and Aile Tamm and Kaupo Kukli and Keith Bambery and Jitraporn Vongsvivut and Saulius Juodkazis and Vijayakumar Anand",

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doi = "10.3390/mi15040537",

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Han, M, Smith, D, Kahro, T, Stonytė, D, Kasikov, A, Gailevičius, D, Tiwari, V, Ignatius Xavier, AP, Gopinath, S, Ng, SH, John Francis Rajeswary, AS, Tamm, A, Kukli, K, Bambery, K, Vongsvivut, J, Juodkazis, S & Anand, V 2024, 'Extending the Depth of Focus of an Infrared Microscope Using a Binary Axicon Fabricated on Barium Fluoride', Micromachines, vol. 15, no. 4, 537. https://doi.org/10.3390/mi15040537

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T1 - Extending the Depth of Focus of an Infrared Microscope Using a Binary Axicon Fabricated on Barium Fluoride

AU - Han, Molong

AU - Smith, Daniel

AU - Kahro, Tauno

AU - Stonytė, Dominyka

AU - Kasikov, Aarne

AU - Gailevičius, Darius

AU - Tiwari, Vipin

AU - Ignatius Xavier, Agnes Pristy

AU - Gopinath, Shivasubramanian

AU - Ng, Soon Hock

AU - John Francis Rajeswary, Aravind Simon

AU - Tamm, Aile

AU - Kukli, Kaupo

AU - Bambery, Keith

AU - Vongsvivut, Jitraporn

AU - Juodkazis, Saulius

AU - Anand, Vijayakumar

PY - 2024/4/1

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AB - Axial resolution is one of the most important characteristics of a microscope. In all microscopes, a high axial resolution is desired in order to discriminate information efficiently along the longitudinal direction. However, when studying thick samples that do not contain laterally overlapping information, a low axial resolution is desirable, as information from multiple planes can be recorded simultaneously from a single camera shot instead of plane-by-plane mechanical refocusing. In this study, we increased the focal depth of an infrared microscope non-invasively by introducing a binary axicon fabricated on a barium fluoride substrate close to the sample. Preliminary results of imaging the thick and sparse silk fibers showed an improved focal depth with a slight decrease in lateral resolution and an increase in background noise.

KW - axial resolution

KW - binary axicon

KW - chemical imaging

KW - femtosecond ablation

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ER -

Extending the Depth of Focus of an Infrared Microscope Using a Binary Axicon Fabricated on Barium Fluoride

Abstract

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