Abstract
Omnidirectional mirrors based on chalcogenide and cryolite were fabricated by thermal evaporation. These mirrors are characterized using a two-dimensional mapping that provides a direct, visual signature. These signatures are presented for different multilayer structures. A mirror with an omnidirectional reflectivity of more than 94% and with a transverse electric omnidirectional reflectivity of more than 99.99% for high-incident angles is demonstrated. A surface roughness of less than 5 nm was obtained.
Original language | English |
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Pages (from-to) | 1810-1812 |
Number of pages | 3 |
Journal | IEEE Photonics Technology Letters |
Volume | 19 |
Issue number | 22 |
DOIs | |
State | Published - 15 Nov 2007 |
Keywords
- Dielectric mirror
- Integrated optics
- Multilayer coating
- Omnidirectional reflector
- Optical properties
- Photonic crystal
- Thin film
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Electrical and Electronic Engineering