Fault-Tolerant Distributed Algorithms on VLSI Chips

Bernadette Charron-Bost, Shlomi Dolev, Jo Ebergen, Ulrich Schmid

Research output: Contribution to journalConference articlepeer-review


The Dagstuhl seminar 08371 on Fault-Tolerant Distributed Algorithms on VLSI Chips was devoted to exploring whether the wealth of existing fault-tolerant distributed algorithms research can be utilized for meeting the challenges of future-generation VLSI chips. Participants from both the distributed fault-tolerant algorithms community, interested in this emerging application domain, and from the VLSI systems-on-chip and digital design community, interested in well-founded system-level approaches to fault-tolerance, surveyed the current state-of-the-art and tried to identify possibilities to work together. The seminar clearly achieved its purpose: It became apparent that most existing research in Distributed Algorithms is too heavy-weight for being immediately applied in the “core” VLSI design context, where power, area etc. are scarce resources. At the same time, however, it was recognized that emerging trends like large multicore chips and increasingly critical applications create new and promising application domains for fault-tolerant distributed algorithms. We are convinced that the very fruitful cross-community interactions that took place during the Dagstuhl seminar will contribute to new research activities in those areas.

Original languageEnglish
JournalDagstuhl Seminar Proceedings
StatePublished - 1 Jan 2009
EventFault-Tolerant Distributed Algorithms on VLSI Chips 2008 - Wadern, Germany
Duration: 7 Sep 200810 Sep 2008


  • Fault-tolerant distributed algorithms
  • VLSI systems-on-chip
  • digital logic
  • fault tolerance
  • specifications
  • synchronous vs. asynchronous circuits

ASJC Scopus subject areas

  • Software
  • Hardware and Architecture
  • Control and Systems Engineering


Dive into the research topics of 'Fault-Tolerant Distributed Algorithms on VLSI Chips'. Together they form a unique fingerprint.

Cite this