Resistance coefficients of surface-exposed residues in apo-yCaM. Surface-exposed residues in the structure of the apo-yCaM N-lobe (PDB: 1F54) were subjected to SMD analysis and the “resistance coefficients” calculated as described in the Methods. For each residue SMD analysis was carried out at least 12 times. The error bars represent the standard error of the mean. Color assignments are according the residues' “resistance coefficients” as described in the legend to Figure 2. (TIF)
Original languageEnglish
StatePublished - 4 Apr 2013


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