Fluctuations in the intensity read out of CCD/CMOS arrays in digital holographic setups: An experimental investigation

Yang Wu, Damien P. Kelly, Adrian Stern, Stefan Sinzinger

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Scopus citations

Abstract

In modern optical systems discrete digital devices for measuring intensity distributions play an indispensible role. The intensity incident on the CCD or CMOS array is averaged over the spatial extent of each pixel for a given exposure time. Fluctuations in the power of a laser, vibrations on an optical table, and electronic noise from the digital sensor all contribute to some degree to a base-line noise level for a particular optical system. Hence we expect that the intensity value measured by each pixel will fluctuate over time. In this paper we investigate the effects of noise of cameras over time using a speckle field for a range of different camera parameters such as exposure time, gain factor, and light power. We then examine how this baseline noise level changes when the incident speckle field is mixed with a plane reference wave forming to form a hologram at the camera plane. We comment on our experimental results and how they apply to general optical systems that measure the phase distribution for a complex field.

Original languageEnglish
Title of host publicationThree-Dimensional Imaging, Visualization, and Display 2014
PublisherSPIE
ISBN (Print)9781628410549
DOIs
StatePublished - 1 Jan 2014
EventThree-Dimensional Imaging, Visualization, and Display 2014 - Baltimore, MD, United States
Duration: 5 May 20147 May 2014

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume9117
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceThree-Dimensional Imaging, Visualization, and Display 2014
Country/TerritoryUnited States
CityBaltimore, MD
Period5/05/147/05/14

Keywords

  • CCD/CMOS arrays
  • Digital holography
  • noise level

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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