Frequency marker based on moiré deflectometry

O. Kafri; D. Meyerstein; Z. Karny

doi:10.1016/0143-8166(83)90006-4

Frequency marker based on moiré deflectometry

O. Kafri
, D. Meyerstein
, Z. Karny

Research output: Contribution to journal › Article › peer-review

3 Scopus citations

Abstract

We propose a new method for frequency marking based on measuring the diffraction angle by moiré deflectometry. The method is demonstrated experimentally.

Original language	English
Pages (from-to)	55-61
Number of pages	7
Journal	Optics and Lasers in Engineering
Volume	4
Issue number	1
DOIs	https://doi.org/10.1016/0143-8166(83)90006-4
State	Published - 1 Jan 1983
Externally published	Yes

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Atomic and Molecular Physics, and Optics
Mechanical Engineering
Electrical and Electronic Engineering

Access to Document

10.1016/0143-8166(83)90006-4

Cite this

@article{da94ab2dda0440f3bedf7341b4bf707b,

title = "Frequency marker based on moir{\'e} deflectometry",

abstract = "We propose a new method for frequency marking based on measuring the diffraction angle by moir{\'e} deflectometry. The method is demonstrated experimentally.",

author = "O. Kafri and D. Meyerstein and Z. Karny",

year = "1983",

month = jan,

day = "1",

doi = "10.1016/0143-8166(83)90006-4",

language = "English",

volume = "4",

pages = "55--61",

journal = "Optics and Lasers in Engineering",

issn = "0143-8166",

publisher = "Elsevier Ltd.",

number = "1",

}

TY - JOUR

T1 - Frequency marker based on moiré deflectometry

AU - Kafri, O.

AU - Meyerstein, D.

AU - Karny, Z.

PY - 1983/1/1

Y1 - 1983/1/1

N2 - We propose a new method for frequency marking based on measuring the diffraction angle by moiré deflectometry. The method is demonstrated experimentally.

AB - We propose a new method for frequency marking based on measuring the diffraction angle by moiré deflectometry. The method is demonstrated experimentally.

UR - https://www.scopus.com/pages/publications/0020632752

U2 - 10.1016/0143-8166(83)90006-4

DO - 10.1016/0143-8166(83)90006-4

M3 - Article

AN - SCOPUS:0020632752

SN - 0143-8166

VL - 4

SP - 55

EP - 61

JO - Optics and Lasers in Engineering

JF - Optics and Lasers in Engineering

IS - 1

ER -

Frequency marker based on moiré deflectometry

Abstract

ASJC Scopus subject areas

Access to Document

Other files and links

Fingerprint

Cite this