Grain boundary diffusion in C60 thin films

E. A. Katz, S. M. Tuladhar, D. Faiman, A. I. Shames, S. Shtutina

Research output: Contribution to journalArticlepeer-review

2 Scopus citations

Abstract

This paper focuses on the effect of grain boundaries on the diffusion processes in polycrystalline C60 thin films. Electrically induced diffusion of Au was investigated by in situ measurements of the film conductivity. Electron Paramagnetic Resonance (EPR) spectroscopy was used to study diffusion of oxygen. Increase in grain sizes in polycrystalline C60 thin films was found to result in the acceleration of gold and oxygen diffusion. The results are interpreted assuming that these impurities diffuse in C60 films dominantly along grain boundaries.

Original languageEnglish
Pages (from-to)331-335
Number of pages5
JournalInterface Science
Volume9
Issue number3-4
DOIs
StatePublished - 1 Nov 2001

Keywords

  • Diffusion
  • Fullerenes
  • Grain boundaries
  • Thin films

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Materials Science (all)
  • Condensed Matter Physics

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