Abstract
This paper focuses on the effect of grain boundaries on the diffusion processes in polycrystalline C60 thin films. Electrically induced diffusion of Au was investigated by in situ measurements of the film conductivity. Electron Paramagnetic Resonance (EPR) spectroscopy was used to study diffusion of oxygen. Increase in grain sizes in polycrystalline C60 thin films was found to result in the acceleration of gold and oxygen diffusion. The results are interpreted assuming that these impurities diffuse in C60 films dominantly along grain boundaries.
Original language | English |
---|---|
Pages (from-to) | 331-335 |
Number of pages | 5 |
Journal | Interface Science |
Volume | 9 |
Issue number | 3-4 |
DOIs | |
State | Published - 1 Nov 2001 |
Keywords
- Diffusion
- Fullerenes
- Grain boundaries
- Thin films
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- General Materials Science
- Condensed Matter Physics