Growth and structure of fullerene thin films and other carbon nanomaterials

E. A. Katz, O. Prilutskiy, D. Faiman, S. Shtutina, V. Ezersky, E. Mogilko

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

The present paper reports relationships between structural characteristics of carbon materials and conditions of their production. C60 thin films were grown by a vacuum deposition technique on various substrates. We demonstrate effect of the substrate material and temperature as well as the deposition rate on the crystalline structure of the films, as measured by X-Ray Diffractometry (XRD) and Atomic Force Microscopy (AFM). Multiwalled carbon nanotubes (MWCNTs) and various nanoclusters, such as carbon-encapsulated nanoclusters of Fe and Fe3O4, were produced by a catalytic disproportionation of carbon monoxide. Structure of these nanomaterials was studied by Transmission Electron Microscopy (TEM) and High Resolution Transmission Electron Microscopy (HRTEM), Energy Dispersive Spectrum (EDS) analysis and XRD.

Original languageEnglish
Title of host publication2003 Nanotechnology Conference and Trade Show - Nanotech 2003
EditorsM. Laudon, B. Romanowicz
Pages553-556
Number of pages4
StatePublished - 1 Dec 2003
Event2003 Nanotechnology Conference and Trade Show - Nanotech 2003 - San Francisco, CA, United States
Duration: 23 Feb 200327 Feb 2003

Publication series

Name2003 Nanotechnology Conference and Trade Show - Nanotech 2003
Volume3

Conference

Conference2003 Nanotechnology Conference and Trade Show - Nanotech 2003
Country/TerritoryUnited States
CitySan Francisco, CA
Period23/02/0327/02/03

Keywords

  • Carbon nanotubes
  • Fullerene thin films
  • Nanocapsules

ASJC Scopus subject areas

  • Engineering (all)

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