High pressure X-ray diffraction study of CdAl2Se4 and Raman study of AAl2Se4 (A=Hg, Zn) and CdAl2X4 (X=Se, S)
S. Meenakshi
, V. Vijyakumar
, B. K. Godwal
, A. Eifler
, I. Orgzall
, S. Tkachev
, H. D. Hochheimer
Research output: Contribution to journal › Article › peer-review
41Scopus
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