High pressure X-ray diffraction study of CdAl2Se4 and Raman study of AAl2Se4 (A=Hg, Zn) and CdAl2X4 (X=Se, S)

S. Meenakshi, V. Vijyakumar, B. K. Godwal, A. Eifler, I. Orgzall, S. Tkachev, H. D. Hochheimer

Research output: Contribution to journal › Article › peer-review

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