High quality textured C60 thin films on a Mica substrate: Growth, crystalline structure, electrical and photoelectric properties

E. A. Katz; D. Faiman; S. Shtutina; A. Isakina; K. Yagotintsev; K. Iakoubovskii

High quality textured C₆₀ thin films on a Mica substrate: Growth, crystalline structure, electrical and photoelectric properties

E. A. Katz, D. Faiman, S. Shtutina, A. Isakina, K. Yagotintsev, K. Iakoubovskii

The Swiss Institute for Dryland Environmental and Energy Research

Research output: Contribution to journal › Conference article › peer-review

6 Scopus citations

Abstract

The paper focuses on some features of the vacuum deposition of polycrystalline C₆₀ thin films on a mica substrate held at high temperatures. The crystalline structure of the films was studied by X-ray diffraction and Atomic Force Microscopy. As a principal result of this study, we report, for the first time, on the possibility of extremely rapid (1-2 nm/s) growth of high quality <111>-textured C₆₀ films onto mica substrates. Temperature-resolved X-ray diffraction revealed that the films undergo a first order phase transition at 252 K with a discontinuity in lattice parameter of 0.22%. The temperature dependence of the dark and photo-conductivity of the films is also presented together with a discussion of the results.

Original language	English
Pages (from-to)	15-20
Number of pages	6
Journal	Solid State Phenomena
Volume	80-81
State	Published - 1 Jan 2001
Event	Solid State Phenomena -Polycrystalline Semiconductors IV. -Materials, Technology, and Large Area Electronics- - Saint Malo, France Duration: 3 Sep 2000 → 7 Sep 2000

Keywords

Crystalline structure
Fullerene
Phase transition
Photoconductivity
Thin films

ASJC Scopus subject areas

Atomic and Molecular Physics, and Optics
General Materials Science
Condensed Matter Physics

Cite this

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title = "High quality textured C60 thin films on a Mica substrate: Growth, crystalline structure, electrical and photoelectric properties",

abstract = "The paper focuses on some features of the vacuum deposition of polycrystalline C60 thin films on a mica substrate held at high temperatures. The crystalline structure of the films was studied by X-ray diffraction and Atomic Force Microscopy. As a principal result of this study, we report, for the first time, on the possibility of extremely rapid (1-2 nm/s) growth of high quality <111>-textured C60 films onto mica substrates. Temperature-resolved X-ray diffraction revealed that the films undergo a first order phase transition at 252 K with a discontinuity in lattice parameter of 0.22%. The temperature dependence of the dark and photo-conductivity of the films is also presented together with a discussion of the results.",

keywords = "Crystalline structure, Fullerene, Phase transition, Photoconductivity, Thin films",

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language = "English",

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journal = "Solid State Phenomena",

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T1 - High quality textured C60 thin films on a Mica substrate

T2 - Solid State Phenomena -Polycrystalline Semiconductors IV. -Materials, Technology, and Large Area Electronics-

AU - Katz, E. A.

AU - Faiman, D.

AU - Shtutina, S.

AU - Isakina, A.

AU - Yagotintsev, K.

AU - Iakoubovskii, K.

PY - 2001/1/1

Y1 - 2001/1/1

N2 - The paper focuses on some features of the vacuum deposition of polycrystalline C60 thin films on a mica substrate held at high temperatures. The crystalline structure of the films was studied by X-ray diffraction and Atomic Force Microscopy. As a principal result of this study, we report, for the first time, on the possibility of extremely rapid (1-2 nm/s) growth of high quality <111>-textured C60 films onto mica substrates. Temperature-resolved X-ray diffraction revealed that the films undergo a first order phase transition at 252 K with a discontinuity in lattice parameter of 0.22%. The temperature dependence of the dark and photo-conductivity of the films is also presented together with a discussion of the results.

AB - The paper focuses on some features of the vacuum deposition of polycrystalline C60 thin films on a mica substrate held at high temperatures. The crystalline structure of the films was studied by X-ray diffraction and Atomic Force Microscopy. As a principal result of this study, we report, for the first time, on the possibility of extremely rapid (1-2 nm/s) growth of high quality <111>-textured C60 films onto mica substrates. Temperature-resolved X-ray diffraction revealed that the films undergo a first order phase transition at 252 K with a discontinuity in lattice parameter of 0.22%. The temperature dependence of the dark and photo-conductivity of the films is also presented together with a discussion of the results.

KW - Crystalline structure

KW - Fullerene

KW - Phase transition

KW - Photoconductivity

KW - Thin films

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M3 - Conference article

AN - SCOPUS:0034831960

SN - 1012-0394

VL - 80-81

SP - 15

EP - 20

JO - Solid State Phenomena

JF - Solid State Phenomena

Y2 - 3 September 2000 through 7 September 2000

ER -

High quality textured C₆₀ thin films on a Mica substrate: Growth, crystalline structure, electrical and photoelectric properties

Abstract

Keywords

ASJC Scopus subject areas

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