Abstract
The single-crystal outperformance of thin film polycrystalline (PX) CdTe/CdS solar cells was analyzed. The defect density of grains was reduced by gettering of defects at the grain boundaries (GB). Scanning capacitance microscopy (SCM) alongwith scanning Kelvin probe microscopy (SKPM) characterize the grain surface electrically. The results show that the separation and collection of photogenerated charge carriers was enhanced by CdTe GB.
Original language | English |
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Pages (from-to) | 879-883 |
Number of pages | 5 |
Journal | Advanced Materials |
Volume | 16 |
Issue number | 11 |
DOIs | |
State | Published - 4 Jun 2004 |
Externally published | Yes |
ASJC Scopus subject areas
- General Materials Science
- Mechanics of Materials
- Mechanical Engineering