HREM assessment of short range order in CdSe quantum dots

EG Bithell; JL Hutchison; Y Golan; E TerOvanesyan; Y Manassen; L Margulis; Gary Hodes; Israel Rubinstein

HREM assessment of short range order in CdSe quantum dots

EG Bithell, JL Hutchison, Y Golan, E TerOvanesyan, Y Manassen, L Margulis, Gary Hodes, Israel Rubinstein

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

We describe an image processing technique which allows the assessment of the extent of short range order in partially ordered thin films from their high resolution images. The approach is illustrated using the example of apparently amorphous CdSe quantum dots on a Pd substrate. We have been able to show that the particles contain a high degree of short range order, and maintain an epitaxial alignment with the Pd substrate. We also demonstrate the wider applications of this method, taking as an example the characterisation of surface layers on FeSbO4.

Original language	English
Title of host publication	Electron Microscopy and Analysis 1995
Subtitle of host publication	Proceedings of the Institute of Physics Electronic Microscopy and Analysis Group Conference
Publisher	Institute of Physics
Pages	79-82
Number of pages	4
Volume	144
ISBN (Print)	0750303573, ‎ 978-0750303576
State	Published - 1 Jan 1995

Publication series

Name	Institute of Physics Conference Series
Publisher	Institute of Physics

Cite this

Bithell, EG., Hutchison, JL., Golan, Y., TerOvanesyan, E., Manassen, Y., Margulis, L., Hodes, G., & Rubinstein, I. (1995). HREM assessment of short range order in CdSe quantum dots. In Electron Microscopy and Analysis 1995: Proceedings of the Institute of Physics Electronic Microscopy and Analysis Group Conference (Vol. 144, pp. 79-82). (Institute of Physics Conference Series). Institute of Physics.

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title = "HREM assessment of short range order in CdSe quantum dots",

abstract = "We describe an image processing technique which allows the assessment of the extent of short range order in partially ordered thin films from their high resolution images. The approach is illustrated using the example of apparently amorphous CdSe quantum dots on a Pd substrate. We have been able to show that the particles contain a high degree of short range order, and maintain an epitaxial alignment with the Pd substrate. We also demonstrate the wider applications of this method, taking as an example the characterisation of surface layers on FeSbO4.",

author = "EG Bithell and JL Hutchison and Y Golan and E TerOvanesyan and Y Manassen and L Margulis and Gary Hodes and Israel Rubinstein",

year = "1995",

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language = "English",

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volume = "144",

series = "Institute of Physics Conference Series",

publisher = "Institute of Physics",

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Bithell, EG, Hutchison, JL, Golan, Y, TerOvanesyan, E, Manassen, Y, Margulis, L, Hodes, G & Rubinstein, I 1995, HREM assessment of short range order in CdSe quantum dots. in Electron Microscopy and Analysis 1995: Proceedings of the Institute of Physics Electronic Microscopy and Analysis Group Conference. vol. 144, Institute of Physics Conference Series, Institute of Physics, pp. 79-82.

HREM assessment of short range order in CdSe quantum dots. / Bithell, EG; Hutchison, JL; Golan, Y et al.
Electron Microscopy and Analysis 1995: Proceedings of the Institute of Physics Electronic Microscopy and Analysis Group Conference. Vol. 144 Institute of Physics, 1995. p. 79-82 (Institute of Physics Conference Series).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - HREM assessment of short range order in CdSe quantum dots

AU - Bithell, EG

AU - Hutchison, JL

AU - Golan, Y

AU - TerOvanesyan, E

AU - Manassen, Y

AU - Margulis, L

AU - Hodes, Gary

AU - Rubinstein, Israel

PY - 1995/1/1

Y1 - 1995/1/1

N2 - We describe an image processing technique which allows the assessment of the extent of short range order in partially ordered thin films from their high resolution images. The approach is illustrated using the example of apparently amorphous CdSe quantum dots on a Pd substrate. We have been able to show that the particles contain a high degree of short range order, and maintain an epitaxial alignment with the Pd substrate. We also demonstrate the wider applications of this method, taking as an example the characterisation of surface layers on FeSbO4.

AB - We describe an image processing technique which allows the assessment of the extent of short range order in partially ordered thin films from their high resolution images. The approach is illustrated using the example of apparently amorphous CdSe quantum dots on a Pd substrate. We have been able to show that the particles contain a high degree of short range order, and maintain an epitaxial alignment with the Pd substrate. We also demonstrate the wider applications of this method, taking as an example the characterisation of surface layers on FeSbO4.

M3 - Conference contribution

SN - 0750303573

SN - ‎ 978-0750303576

VL - 144

T3 - Institute of Physics Conference Series

SP - 79

EP - 82

BT - Electron Microscopy and Analysis 1995

PB - Institute of Physics

ER -

HREM assessment of short range order in CdSe quantum dots

Abstract

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