HREM assessment of short range order in CdSe quantum dots

EG Bithell, JL Hutchison, Y Golan, E TerOvanesyan, Y Manassen, L Margulis, Gary Hodes, Israel Rubinstein

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review


We describe an image processing technique which allows the assessment of the extent of short range order in partially ordered thin films from their high resolution images. The approach is illustrated using the example of apparently amorphous CdSe quantum dots on a Pd substrate. We have been able to show that the particles contain a high degree of short range order, and maintain an epitaxial alignment with the Pd substrate. We also demonstrate the wider applications of this method, taking as an example the characterisation of surface layers on FeSbO4.
Original languageEnglish
Title of host publicationElectron Microscopy and Analysis 1995
Subtitle of host publicationProceedings of the Institute of Physics Electronic Microscopy and Analysis Group Conference
PublisherInstitute of Physics
Number of pages4
ISBN (Print)0750303573, ‎ 978-0750303576
StatePublished - 1 Jan 1995

Publication series

NameInstitute of Physics Conference Series
PublisherInstitute of Physics


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