Abstract
HREM images of CdSe nanocrystals on a Au substrate were calculated for different relative shift of the Au and CdSe unitcells. The calculations proved that the added shift had significant influence on the images of the CdSe nanocrystals with thickness from 0.7 nm to 3.5 nm in the case of no tilt imaging condition. Experimental images exhibiting 1/3{422}Au and {10.0}CdSe patterns were simulated. A good fit between the experimental and calculated images were obtained in the tilted condition where the calculated images were very similar for different shifts. The thickness of the CdSe nanocrystals was estimated to be ca. 3 nm.
Original language | English |
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Pages (from-to) | 193-196 |
Number of pages | 4 |
Journal | Electron Technology (Warsaw) |
Volume | 31 |
Issue number | 2 |
State | Published - 1 Dec 1998 |
Externally published | Yes |
Event | Proceedings of the 1997 Polish-Japanese Joint Seminar on Material Analysis - Warszawa, Pol Duration: 1 Sep 1997 → 3 Sep 1997 |
ASJC Scopus subject areas
- General Engineering