Hunting down the bubble makers in fabs

M. Hassoun, G. Rabinowitz

Research output: Contribution to journalArticlepeer-review

5 Scopus citations

Abstract

Based on a simulated Non Volatile Memory fab, we employ data-mining to identify and quantify the apparent causes of work in process bubbles along the process. The chosen bubble formalization methods proved able to detect the phenomenon and enabled its occurrence frequency to be forecasted. In the chosen environment, bubbles seem to be highly correlated with the utilization patterns of the process segment considered.

Original languageEnglish
Article number5357373
Pages (from-to)13-20
Number of pages8
JournalIEEE Transactions on Semiconductor Manufacturing
Volume23
Issue number1
DOIs
StatePublished - 1 Feb 2010

Keywords

  • Congestion
  • Production management
  • Semiconductors
  • Work-in-process

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