Skip to main navigation
Skip to search
Skip to main content
Ben-Gurion University Research Portal Home
Help & FAQ
Link opens in a new tab
Search content at Ben-Gurion University Research Portal
Home
Profiles
Research output
Research units
Prizes
Press/Media
Student theses
Projects
Activities
Datasets
Research Labs
IBIC studies of structural defect activity in different polycrystalline silicon material
V. Borjanović
, M. Jakšić
, Ž Pastuović
, B. Pivac
,
E. Katz
Research output
:
Contribution to journal
›
Article
›
peer-review
Overview
Fingerprint
Fingerprint
Dive into the research topics of 'IBIC studies of structural defect activity in different polycrystalline silicon material'. Together they form a unique fingerprint.
Sort by
Weight
Alphabetically
Keyphrases
Structural Defects
100%
Polysilicon
100%
Charge Collection
100%
Silicon Material
100%
Ion Beam Induced Charge
100%
Electrical Activity
66%
Spatial Distribution
33%
Electronic Devices
33%
Extended Defects
33%
Collection Method
33%
Spatial Data
33%
Light Influence
33%
Charge Collection Efficiency
33%
Semiconducting Materials
33%
Poly-Si
33%
Electrically Active Defects
33%
Impurity Oxygen
33%
Light Impurities
33%
Device Characteristics
33%
Nuclear Microprobe
33%
Chemistry
Silicon
100%
Ion Beam
100%
electronics
33%
Material Science
Semiconducting Material
100%
Silicon Material
100%
Chemical Engineering
Polysilicon
100%