Abstract
Measurement of photoconductivity spectral response over the wavelength range of 220 to 950 nm, linearity with intensity over the optical power range of 10 nW to 4 pW, I-V characteristics, response time, and C-V curves were made on Zn3P2 thin-fiim samples. The results include slow response time (on the order of a few seconds), maximum photoconductivity response at 400 nm wavelength, and non-linear I-V characteristics. Changes in device characteristics, due to vacuum operation and heat treatment, indicate that surface effects and intergrain boundaries can play important roles in determining the properties of thin film Zn3P2, primarily as regards the surface conductivity and a depletion layer which penetrates into the bulk material.
Original language | English |
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Pages (from-to) | 58-61 |
Number of pages | 4 |
Journal | Proceedings of SPIE - The International Society for Optical Engineering |
Volume | 687 |
DOIs | |
State | Published - 10 Dec 1986 |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Computer Science Applications
- Applied Mathematics
- Electrical and Electronic Engineering