In situ ellipsometry for shock compression measurements

L. Bakshi, S. Eliezer, G. Appelbaum, N. Nissim, L. Perelmutter, M. Mond

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Knowledge about the optical properties of materials at high pressure and high temperature is needed for EOS research. Ellipsometry measures the change in the polarization of a probe beam reflected from a surface. From the change in polarization, the real and imaginary parts of the time dependent complex index of refraction can be extracted. From the measured optical properties, fundamental physical properties of the material, such as emissivity, phase transitions, and electrical conductivity can be extracted. A dynamic ellipsometry measurement system with nanosecond resolution was built in order to measure all four stocks parameters. Gas gun was used to accelerate the impact flyer. Our experiments concentrated on the optical properties of 1020 steel targets with impact pressure range of 40-250 kbar. Although there are intrinsic difficulties with dynamic ellipsometric measurements, distinct changes were observed for 1020 steel under shock compression larger than 130 kbar, the α→ε phase transition.

Original languageEnglish
Title of host publicationShock Compression of Condensed Matter - 2009 - Proceedings of the Conference of the American Physical Society Topical Group on Shock Compression of Condensed Matter
Pages631-634
Number of pages4
DOIs
StatePublished - 1 Dec 2009
EventConference of the American Physical Society Topical Group on Shock Compression of Condensed Matter, 2009 APS SCCM - Nashville, TN, United States
Duration: 28 Jun 20093 Jul 2009

Publication series

NameAIP Conference Proceedings
Volume1195
ISSN (Print)0094-243X
ISSN (Electronic)1551-7616

Conference

ConferenceConference of the American Physical Society Topical Group on Shock Compression of Condensed Matter, 2009 APS SCCM
Country/TerritoryUnited States
CityNashville, TN
Period28/06/093/07/09

Keywords

  • Ellipsometry
  • Emissivity
  • Optical properties
  • Phase transitions

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