In situ imaging of shearing contacts in the surface forces apparatus

Yuval Golan; Carlos Drummond; Jacob Israelachvili; Reshef Tenne

doi:10.1016/S0043-1648(00)00478-6

In situ imaging of shearing contacts in the surface forces apparatus

Yuval Golan, Carlos Drummond, Jacob Israelachvili, Reshef Tenne

Department of Materials Engineering

Research output: Contribution to journal › Article › peer-review

23 Scopus citations

Abstract

Multiple beam interferometry (MBI) can be used in the surface forces apparatus for in situ topographical imaging in real-time of the contact between two shearing surfaces at ultrahigh resolution in the normal direction at the same time as friction forces are measured. Simultaneous measurements were made of the friction forces between two shearing mica surfaces separated by WS₂ (inorganic) fullerene, and non-fullerene WS₂ nanoparticle additives in tetradecane. The results were correlated with the very different transfer layers formed in each case, as visualized by in situ MBI and ex situ atomic force microscopy.

Original language	English
Pages (from-to)	190-195
Number of pages	6
Journal	Wear
Volume	245
Issue number	1-2
DOIs	https://doi.org/10.1016/S0043-1648(00)00478-6
State	Published - 1 Jan 2000

Keywords

Atomic force microscopy
Inorganic fullerenes
Multiple beam interferometry
Nanoparticles
Surface force apparatus

ASJC Scopus subject areas

Condensed Matter Physics
Mechanics of Materials
Surfaces and Interfaces
Surfaces, Coatings and Films
Materials Chemistry

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10.1016/S0043-1648(00)00478-6

Cite this

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title = "In situ imaging of shearing contacts in the surface forces apparatus",

abstract = "Multiple beam interferometry (MBI) can be used in the surface forces apparatus for in situ topographical imaging in real-time of the contact between two shearing surfaces at ultrahigh resolution in the normal direction at the same time as friction forces are measured. Simultaneous measurements were made of the friction forces between two shearing mica surfaces separated by WS2 (inorganic) fullerene, and non-fullerene WS2 nanoparticle additives in tetradecane. The results were correlated with the very different transfer layers formed in each case, as visualized by in situ MBI and ex situ atomic force microscopy.",

keywords = "Atomic force microscopy, Inorganic fullerenes, Multiple beam interferometry, Nanoparticles, Surface force apparatus",

author = "Yuval Golan and Carlos Drummond and Jacob Israelachvili and Reshef Tenne",

note = "Funding Information: J.I. acknowledges the support of the Office of Naval Research for supporting this research under Grant N00014-93-1-0269. This work made use of the MRL Central Facilities supported by the NSF under award DMR-9123048. R.T. acknowledges the support of the ACS-PRF foundation (USA) and the US–Israel Binational Science Foundation. C.D. acknowledges the support of INTEVEP S.A., Venezuela.",

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doi = "10.1016/S0043-1648(00)00478-6",

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T1 - In situ imaging of shearing contacts in the surface forces apparatus

AU - Golan, Yuval

AU - Drummond, Carlos

AU - Israelachvili, Jacob

AU - Tenne, Reshef

N1 - Funding Information: J.I. acknowledges the support of the Office of Naval Research for supporting this research under Grant N00014-93-1-0269. This work made use of the MRL Central Facilities supported by the NSF under award DMR-9123048. R.T. acknowledges the support of the ACS-PRF foundation (USA) and the US–Israel Binational Science Foundation. C.D. acknowledges the support of INTEVEP S.A., Venezuela.

PY - 2000/1/1

Y1 - 2000/1/1

N2 - Multiple beam interferometry (MBI) can be used in the surface forces apparatus for in situ topographical imaging in real-time of the contact between two shearing surfaces at ultrahigh resolution in the normal direction at the same time as friction forces are measured. Simultaneous measurements were made of the friction forces between two shearing mica surfaces separated by WS2 (inorganic) fullerene, and non-fullerene WS2 nanoparticle additives in tetradecane. The results were correlated with the very different transfer layers formed in each case, as visualized by in situ MBI and ex situ atomic force microscopy.

AB - Multiple beam interferometry (MBI) can be used in the surface forces apparatus for in situ topographical imaging in real-time of the contact between two shearing surfaces at ultrahigh resolution in the normal direction at the same time as friction forces are measured. Simultaneous measurements were made of the friction forces between two shearing mica surfaces separated by WS2 (inorganic) fullerene, and non-fullerene WS2 nanoparticle additives in tetradecane. The results were correlated with the very different transfer layers formed in each case, as visualized by in situ MBI and ex situ atomic force microscopy.

KW - Atomic force microscopy

KW - Inorganic fullerenes

KW - Multiple beam interferometry

KW - Nanoparticles

KW - Surface force apparatus

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DO - 10.1016/S0043-1648(00)00478-6

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SN - 0043-1648

VL - 245

SP - 190

EP - 195

JO - Wear

JF - Wear

IS - 1-2

ER -

In situ imaging of shearing contacts in the surface forces apparatus

Abstract

Keywords

ASJC Scopus subject areas

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