Influence of the fabrication conditions of polymorphous silicon films on their structural, electrical and optical properties

M. V. Khenkin, A. V. Emelyanov, A. G. Kazanskii, P. A. Forsh, P. K. Kashkarov, E. I. Terukov, D. L. Orekhov, P. Roca i Cabarrocas

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