Infrared emission from silicon and metallic lamellar grating

Nathan Pinhas, Shlomo Hava

Research output: Contribution to journalConference articlepeer-review


The infrared normal spectral emissions from degenerate (metallic-like) silicon and metallic (nickel) lamellar grating structures were investigated. The gratings were micromachined on (110) silicon wafer was with differing periods, groove widths and groove depths, where the dimensions of all samples were with feature sizes comparable to the measurement wavelengths (2.5 - 25 μm). The measurement temperatures for all samples were in the range 27 to 740°C. Infrared normal transmission through diffraction was also measured. In general, it was found that the spectral emission of the metallic gratings was different from the degenerate silicon grating. This because the bulk absorption in the silicon samples was affecting the emission.

Original languageEnglish
Pages (from-to)628-632
Number of pages5
JournalProceedings of SPIE - The International Society for Optical Engineering
StatePublished - 19 Sep 2003
EventNonatechnology - Maspalomas, Gran Canaria, Spain
Duration: 19 May 200321 May 2003


  • Infrared emission
  • Infrared radiation
  • Microstructures

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering


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