Infrared image denoising by non-local means filtering

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

4 Scopus citations

Abstract

The recently introduced non-local means (NLM) image denoising technique broke the traditional paradigm according to which image pixels are processed by their surroundings. Non-local means technique was demonstrated to outperform state-of-the art denoising techniques when applied to images in the visible. This technique is even more powerful when applied to low contrast images, which makes it tractable for denoising infrared (IR) images. In this work we investigate the performance of NLM applied to infrared images. We also present a new technique designed to speed-up the NLM filtering process. The main drawback of the NLM is the large computational time required by the process of searching similar patches. Several techniques were developed during the last years to reduce the computational burden. Here we present a new techniques designed to reduce computational cost and sustain optimal filtering results of NLM technique. We show that the new technique, which we call Multi-Resolution Search NLM (MRS-NLM), reduces significantly the computational cost of the filtering process and we present a study of its performance on IR images.

Original languageEnglish
Title of host publicationVisual Information Processing XXI
DOIs
StatePublished - 25 Jun 2012
EventVisual Information Processing XXI - Baltimore, MD, United States
Duration: 24 Apr 201225 Apr 2012

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume8399
ISSN (Print)0277-786X

Conference

ConferenceVisual Information Processing XXI
Country/TerritoryUnited States
CityBaltimore, MD
Period24/04/1225/04/12

Keywords

  • image denoising
  • multi-resolution analysis
  • non-local means

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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