Abstract
The initial adsorption kinetics of oxygen on a sputter-cleaned surface of polycrystalline copper was studied at room-temperature utilizing combined measurements with Auger electron spectroscopy (AES) and time-of-flight spectrometry of direct recoils (TOF-DR). These combined measurements enable one to distinguish between adsorption processes occurring simultaneously on different structural arrays present on the polycrystalline surface. Modeling the surface as composed of two types of arrays, i.e. "rough" (e.g. ridged planes, defects and irradiation damaged areas) and "smooth", it is possible to obtain quantitative kinetic data regarding adsorption on these local arrays. The "rough" arrays on polycrystalline copper display kinetic behavior similar to the ridged (110) plane of copper single-crystal. The "smooth" arrays on the other hand display initial sticking probabilities higher than obtained for single-crystals. This difference has been accounted for by an "equilibrium spillover" model assuming surface migration of adsorbed oxygen from the "rough" to the "smooth" arrays.
| Original language | English |
|---|---|
| Pages (from-to) | 413-430 |
| Number of pages | 18 |
| Journal | Surface Science |
| Volume | 185 |
| Issue number | 3 |
| DOIs | |
| State | Published - 1 Jul 1987 |
| Externally published | Yes |
ASJC Scopus subject areas
- Condensed Matter Physics
- Surfaces and Interfaces
- Surfaces, Coatings and Films
- Materials Chemistry