Interferometric study of concentration profiles in solutions near membrane surfaces

C. Forgacs, J. Leibovitz, R. N. O'Brien, K. S. Spiegler

Research output: Contribution to journalArticlepeer-review

27 Scopus citations

Abstract

A new technique for the observation and interpretation of concentration profiles in diffusion layers at membrane-solution interfaces was developed. The concentration profiles in dilute (0·01N) KCl solutions near an ion-exchange membrane were observed in a modified O'Brien-type wedge laser interferometer while electric current (1·15 and 2·3 mA cm-2) passed through the solution (25°C). After current reversal, following prepolarization periods of 5-60 s, a concentration minimum develops. The image of this minimum in relation to the membrane surface is not subject to optical deflection and can therefore be accurately determined. From its trajectory, the salt concentration at the membrane surface at the time of current reversal was determined. It was found that as this concentration dropped to the order of 10-3-10-4M ("critical concentration") significant deviations occurred between observed trajectories and those computed from a theory based on the Nernst-Planck equations. These deviations are believed to be caused by substantial migration of H+ and OH-. While these measurements indicate the order of magnitude of the critical concentration, additional measurements are necessary for quantitative determination of this concentration under different physicochemical and hydrodynamic conditions.

Original languageEnglish
Pages (from-to)555-563
Number of pages9
JournalElectrochimica Acta
Volume20
Issue number8
DOIs
StatePublished - 1 Jan 1975
Externally publishedYes

ASJC Scopus subject areas

  • General Chemical Engineering
  • Electrochemistry

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