IR transmission and reflection study of lamellar silicon grating-wafer structures

S. Hava; M. Auslender; B. M. Lacquet; P. J. Coetzer; P. L. Swart

doi:10.1016/1350-4495(94)00043-K

IR transmission and reflection study of lamellar silicon grating-wafer structures

S. Hava, M. Auslender, B. M. Lacquet, P. J. Coetzer, P. L. Swart

Department of Electrical & Computer Engineering

Research output: Contribution to journal › Article › peer-review

8 Scopus citations

Abstract

IR normal transmission and angular reflection spectra are studied for lamellar silicon grating-wafer structures. The grating dimensions are comparable with the radiation wavelengths 2.2-22 μm. The spectra were measured using the FTIR system. Numerical simulations of the spectra were carried out using an operator-vector version of rigorous-coupled wave analysis. The theoretical results are in agreement with the measured spectra. The effect of grating structure on the manifestation of two inherent light absorption mechanisms of bulk silicon-interstitial oxygen vibrations and lattice phonons-is discussed. The results indicate the possibility of obtaining a narrow spectral absorber.

Original language	English
Pages (from-to)	639-647
Number of pages	9
Journal	Infrared Physics and Technology
Volume	36
Issue number	2
DOIs	https://doi.org/10.1016/1350-4495(94)00043-K
State	Published - 1 Jan 1995

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Atomic and Molecular Physics, and Optics
Condensed Matter Physics

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10.1016/1350-4495(94)00043-K

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title = "IR transmission and reflection study of lamellar silicon grating-wafer structures",

abstract = "IR normal transmission and angular reflection spectra are studied for lamellar silicon grating-wafer structures. The grating dimensions are comparable with the radiation wavelengths 2.2-22 μm. The spectra were measured using the FTIR system. Numerical simulations of the spectra were carried out using an operator-vector version of rigorous-coupled wave analysis. The theoretical results are in agreement with the measured spectra. The effect of grating structure on the manifestation of two inherent light absorption mechanisms of bulk silicon-interstitial oxygen vibrations and lattice phonons-is discussed. The results indicate the possibility of obtaining a narrow spectral absorber.",

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T1 - IR transmission and reflection study of lamellar silicon grating-wafer structures

AU - Hava, S.

AU - Auslender, M.

AU - Lacquet, B. M.

AU - Coetzer, P. J.

AU - Swart, P. L.

PY - 1995/1/1

Y1 - 1995/1/1

N2 - IR normal transmission and angular reflection spectra are studied for lamellar silicon grating-wafer structures. The grating dimensions are comparable with the radiation wavelengths 2.2-22 μm. The spectra were measured using the FTIR system. Numerical simulations of the spectra were carried out using an operator-vector version of rigorous-coupled wave analysis. The theoretical results are in agreement with the measured spectra. The effect of grating structure on the manifestation of two inherent light absorption mechanisms of bulk silicon-interstitial oxygen vibrations and lattice phonons-is discussed. The results indicate the possibility of obtaining a narrow spectral absorber.

AB - IR normal transmission and angular reflection spectra are studied for lamellar silicon grating-wafer structures. The grating dimensions are comparable with the radiation wavelengths 2.2-22 μm. The spectra were measured using the FTIR system. Numerical simulations of the spectra were carried out using an operator-vector version of rigorous-coupled wave analysis. The theoretical results are in agreement with the measured spectra. The effect of grating structure on the manifestation of two inherent light absorption mechanisms of bulk silicon-interstitial oxygen vibrations and lattice phonons-is discussed. The results indicate the possibility of obtaining a narrow spectral absorber.

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U2 - 10.1016/1350-4495(94)00043-K

DO - 10.1016/1350-4495(94)00043-K

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SN - 1350-4495

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SP - 639

EP - 647

JO - Infrared Physics and Technology

JF - Infrared Physics and Technology

IS - 2

ER -

IR transmission and reflection study of lamellar silicon grating-wafer structures

Abstract

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