Irradiation induced pulsations of reverse biased metal oxide/silicon structures

D. Fink; A. Kiv; D. Fuks; M. Tabacnics; M. De A. Rizutto; A. De O.D. Silva; A. Chandra; V. Golovanov; M. Ivanovskaya; L. Khirunenko

doi:10.1063/1.2773950

Irradiation induced pulsations of reverse biased metal oxide/silicon structures

D. Fink
, A. Kiv
, D. Fuks
, M. Tabacnics
, M. De A. Rizutto
, A. De O.D. Silva
, A. Chandra
, V. Golovanov
, M. Ivanovskaya
, L. Khirunenko

Department of Materials Engineering

Research output: Contribution to journal › Article › peer-review

6 Scopus citations

Abstract

Specific electronic features have been found in structures consisting of metal oxide layers on silicon substrates upon swift heavy ion irradiation. These features are linked to the appearance of radiation-induced negative differential resistances in the structures. In the reversed bias direction they show high frequency current pulsations at around ∼10 kHz frequency. Their amplitude increases with increasing applied voltage. The pulsation frequency also shows a small increase. The current amplitude depends on the ion fluence and flux.

Original language	English
Article number	083512
Journal	Applied Physics Letters
Volume	91
Issue number	8
DOIs	https://doi.org/10.1063/1.2773950
State	Published - 31 Aug 2007

ASJC Scopus subject areas

Physics and Astronomy (miscellaneous)

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title = "Irradiation induced pulsations of reverse biased metal oxide/silicon structures",

abstract = "Specific electronic features have been found in structures consisting of metal oxide layers on silicon substrates upon swift heavy ion irradiation. These features are linked to the appearance of radiation-induced negative differential resistances in the structures. In the reversed bias direction they show high frequency current pulsations at around ∼10 kHz frequency. Their amplitude increases with increasing applied voltage. The pulsation frequency also shows a small increase. The current amplitude depends on the ion fluence and flux.",

author = "D. Fink and A. Kiv and D. Fuks and M. Tabacnics and Rizutto, \{M. De A.\} and Silva, \{A. De O.D.\} and A. Chandra and V. Golovanov and M. Ivanovskaya and L. Khirunenko",

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month = aug,

day = "31",

doi = "10.1063/1.2773950",

language = "English",

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journal = "Applied Physics Letters",

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T1 - Irradiation induced pulsations of reverse biased metal oxide/silicon structures

AU - Fink, D.

AU - Kiv, A.

AU - Fuks, D.

AU - Tabacnics, M.

AU - Rizutto, M. De A.

AU - Silva, A. De O.D.

AU - Chandra, A.

AU - Golovanov, V.

AU - Ivanovskaya, M.

AU - Khirunenko, L.

PY - 2007/8/31

Y1 - 2007/8/31

N2 - Specific electronic features have been found in structures consisting of metal oxide layers on silicon substrates upon swift heavy ion irradiation. These features are linked to the appearance of radiation-induced negative differential resistances in the structures. In the reversed bias direction they show high frequency current pulsations at around ∼10 kHz frequency. Their amplitude increases with increasing applied voltage. The pulsation frequency also shows a small increase. The current amplitude depends on the ion fluence and flux.

AB - Specific electronic features have been found in structures consisting of metal oxide layers on silicon substrates upon swift heavy ion irradiation. These features are linked to the appearance of radiation-induced negative differential resistances in the structures. In the reversed bias direction they show high frequency current pulsations at around ∼10 kHz frequency. Their amplitude increases with increasing applied voltage. The pulsation frequency also shows a small increase. The current amplitude depends on the ion fluence and flux.

UR - https://www.scopus.com/pages/publications/34548215275

U2 - 10.1063/1.2773950

DO - 10.1063/1.2773950

M3 - Article

AN - SCOPUS:34548215275

SN - 0003-6951

VL - 91

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 8

M1 - 083512

ER -

Irradiation induced pulsations of reverse biased metal oxide/silicon structures

Abstract

ASJC Scopus subject areas

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