TY - GEN
T1 - Joint segmentation and registration of elastically deformable objects
AU - Cohen, Gilad
AU - Francos, Joseph M.
AU - Hagege, Rami
PY - 2008/1/1
Y1 - 2008/1/1
N2 - We present a new approach to the general problem of template-based segmentation, detection, and registration. This joint problem is highly nonlinear and high dimensional, due to the large space of possible geometric transformations between a given template and its observed signature. Hence, any attempt to directly solve it inevitably leads to a high dimensional, nonlinear, non-convex optimization procedure. We propose a novel parametric solution to this problem, by showing that it can be equivalently represented by a low dimensional model, that is linear in the deformation parameters, and biased by the unknown observation background. Classical linear methods are then employed to estimate the deformation parameters, providing an explicit solution for the joint segmentation and registration problem.
AB - We present a new approach to the general problem of template-based segmentation, detection, and registration. This joint problem is highly nonlinear and high dimensional, due to the large space of possible geometric transformations between a given template and its observed signature. Hence, any attempt to directly solve it inevitably leads to a high dimensional, nonlinear, non-convex optimization procedure. We propose a novel parametric solution to this problem, by showing that it can be equivalently represented by a low dimensional model, that is linear in the deformation parameters, and biased by the unknown observation background. Classical linear methods are then employed to estimate the deformation parameters, providing an explicit solution for the joint segmentation and registration problem.
UR - http://www.scopus.com/inward/record.url?scp=77957958885&partnerID=8YFLogxK
U2 - 10.1109/icpr.2008.4761519
DO - 10.1109/icpr.2008.4761519
M3 - Conference contribution
AN - SCOPUS:77957958885
SN - 9781424421756
T3 - Proceedings - International Conference on Pattern Recognition
BT - 2008 19th International Conference on Pattern Recognition, ICPR 2008
PB - Institute of Electrical and Electronics Engineers
ER -