Kelvin probe force microscopy using near-field optical tips

R. Shikler, Y. Rosenwaks

Research output: Contribution to journalConference articlepeer-review

3 Scopus citations

Abstract

We report on the use of near-field optical force sensors for Kelvin probe force microscopy (KPFM) and surface potential measurements. It is shown that a very good potential sensitivity of less than 5 mV can be obtained using such tips. In addition, it is found that the contact potential difference measured using these tips is independent of the scanning height, as long as it is below 40 nm, and of the applied AC amplitude as long as it is in the range of 1-3 V.

Original languageEnglish
Pages (from-to)256-262
Number of pages7
JournalApplied Surface Science
Volume157
Issue number4
DOIs
StatePublished - 2 Apr 2000
Externally publishedYes
EventNC-AFM'99: 2nd International Workshop on Nancontact Atomic Force Microscopy - Pontresina, Switz
Duration: 1 Sep 19994 Sep 1999

ASJC Scopus subject areas

  • Chemistry (all)
  • Condensed Matter Physics
  • Physics and Astronomy (all)
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films

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