Abstract
We report on the use of near-field optical force sensors for Kelvin probe force microscopy (KPFM) and surface potential measurements. It is shown that a very good potential sensitivity of less than 5 mV can be obtained using such tips. In addition, it is found that the contact potential difference measured using these tips is independent of the scanning height, as long as it is below 40 nm, and of the applied AC amplitude as long as it is in the range of 1-3 V.
Original language | English |
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Pages (from-to) | 256-262 |
Number of pages | 7 |
Journal | Applied Surface Science |
Volume | 157 |
Issue number | 4 |
DOIs | |
State | Published - 2 Apr 2000 |
Externally published | Yes |
Event | NC-AFM'99: 2nd International Workshop on Nancontact Atomic Force Microscopy - Pontresina, Switz Duration: 1 Sep 1999 → 4 Sep 1999 |
ASJC Scopus subject areas
- Chemistry (all)
- Condensed Matter Physics
- Physics and Astronomy (all)
- Surfaces and Interfaces
- Surfaces, Coatings and Films