Kelvin probe force microscopy using near-field optical tips

R. Shikler; Y. Rosenwaks

doi:10.1016/S0169-4332(99)00536-X

Kelvin probe force microscopy using near-field optical tips

R. Shikler, Y. Rosenwaks

Research output: Contribution to journal › Conference article › peer-review

4 Scopus citations

Abstract

We report on the use of near-field optical force sensors for Kelvin probe force microscopy (KPFM) and surface potential measurements. It is shown that a very good potential sensitivity of less than 5 mV can be obtained using such tips. In addition, it is found that the contact potential difference measured using these tips is independent of the scanning height, as long as it is below 40 nm, and of the applied AC amplitude as long as it is in the range of 1-3 V.

Original language	English
Pages (from-to)	256-262
Number of pages	7
Journal	Applied Surface Science
Volume	157
Issue number	4
DOIs	https://doi.org/10.1016/S0169-4332(99)00536-X
State	Published - 2 Apr 2000
Externally published	Yes
Event	NC-AFM'99: 2nd International Workshop on Nancontact Atomic Force Microscopy - Pontresina, Switz Duration: 1 Sep 1999 → 4 Sep 1999

ASJC Scopus subject areas

General Chemistry
Condensed Matter Physics
General Physics and Astronomy
Surfaces and Interfaces
Surfaces, Coatings and Films

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10.1016/S0169-4332(99)00536-X

Cite this

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title = "Kelvin probe force microscopy using near-field optical tips",

abstract = "We report on the use of near-field optical force sensors for Kelvin probe force microscopy (KPFM) and surface potential measurements. It is shown that a very good potential sensitivity of less than 5 mV can be obtained using such tips. In addition, it is found that the contact potential difference measured using these tips is independent of the scanning height, as long as it is below 40 nm, and of the applied AC amplitude as long as it is in the range of 1-3 V.",

author = "R. Shikler and Y. Rosenwaks",

note = "Funding Information: This research is supported by the Israel Science foundation administered by the Israel Academy of Science and Humanities-Recanati and IDB group foundation, and by grant 9701 of the Israel Ministry of Science. R.S. is supported be Eshkol special scholarship of Israel Ministry of Science.; NC-AFM'99: 2nd International Workshop on Nancontact Atomic Force Microscopy ; Conference date: 01-09-1999 Through 04-09-1999",

year = "2000",

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doi = "10.1016/S0169-4332(99)00536-X",

language = "English",

volume = "157",

pages = "256--262",

journal = "Applied Surface Science",

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publisher = "Elsevier B.V.",

number = "4",

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T1 - Kelvin probe force microscopy using near-field optical tips

AU - Shikler, R.

AU - Rosenwaks, Y.

N1 - Funding Information: This research is supported by the Israel Science foundation administered by the Israel Academy of Science and Humanities-Recanati and IDB group foundation, and by grant 9701 of the Israel Ministry of Science. R.S. is supported be Eshkol special scholarship of Israel Ministry of Science.

PY - 2000/4/2

Y1 - 2000/4/2

N2 - We report on the use of near-field optical force sensors for Kelvin probe force microscopy (KPFM) and surface potential measurements. It is shown that a very good potential sensitivity of less than 5 mV can be obtained using such tips. In addition, it is found that the contact potential difference measured using these tips is independent of the scanning height, as long as it is below 40 nm, and of the applied AC amplitude as long as it is in the range of 1-3 V.

AB - We report on the use of near-field optical force sensors for Kelvin probe force microscopy (KPFM) and surface potential measurements. It is shown that a very good potential sensitivity of less than 5 mV can be obtained using such tips. In addition, it is found that the contact potential difference measured using these tips is independent of the scanning height, as long as it is below 40 nm, and of the applied AC amplitude as long as it is in the range of 1-3 V.

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U2 - 10.1016/S0169-4332(99)00536-X

DO - 10.1016/S0169-4332(99)00536-X

M3 - Conference article

AN - SCOPUS:0033749428

SN - 0169-4332

VL - 157

SP - 256

EP - 262

JO - Applied Surface Science

JF - Applied Surface Science

IS - 4

T2 - NC-AFM'99: 2nd International Workshop on Nancontact Atomic Force Microscopy

Y2 - 1 September 1999 through 4 September 1999

ER -

Kelvin probe force microscopy using near-field optical tips

Abstract

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