Leakage reduction in advanced image sensors using an improved AB 2C scheme

Adam Teman, Orly Yadid-Pecht, Alexander Fish

Research output: Contribution to journalArticlepeer-review

2 Scopus citations


Static leakage currents in advanced CMOS processes have become the main source of power consumption in many of today's systems. This is especially true for systems with a large number of devices that are in a stable state for most of their operation time, such as image sensors and memory arrays. This paper introduces an improved adaptive bulk biasing control (AB 2C) scheme for reduction of leakage currents during these standby periods in serially accessed arrays, while enabling device acceleration during active cycles. We provide a theoretical analysis of the AB 2C operation, showing its advantages and limitations. The proposed scheme has been integrated with a test-case advanced wide dynamic range (WDR) image sensor with an on-chip memory. The scheme was applied to both the pixel and bitcell arrays, providing configurable leakage reduction and performance enhancement. An 80 nm test chip was fabricated with a 10 k pixel/bitcell test-case system and successfully tested, showing a 21% power reduction compared to a standard system and up to 44% compared to an accelerated system.

Original languageEnglish
Article number5771526
Pages (from-to)773-784
Number of pages12
JournalIEEE Sensors Journal
Issue number4
StatePublished - 20 Feb 2012


  • Advanced bulk biasing control
  • advanced image sensors
  • forward body biasing
  • leakage reduction
  • low power SRAM
  • low power image sensors
  • reverse body biasing

ASJC Scopus subject areas

  • Instrumentation
  • Electrical and Electronic Engineering


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