Log likelihood ratio distortion measures for scalar time varying and stationary vector processes

Ilan D. Shallom; Felix A. Flomen; Arnon Cohen

doi:10.1109/EEIS.1989.720151

Log likelihood ratio distortion measures for scalar time varying and stationary vector processes

Ilan D. Shallom, Felix A. Flomen, Arnon Cohen

Department of Electrical & Computer Engineering

Research output: Contribution to conference › Paper › peer-review

2 Scopus citations

Abstract

In this paper, two distortion measures, based on the well known statistical Log Likelihood Ratio (LLR) criterion are presented. The first one is developed for non-stationary scalar processes, represented by a Time Varying Autoregressive (TV AR) model and the second for stationary vector processes, represented by a Multichannel Autoregressive (MC AR) model. The asymptotic distribution of the proposed measures is briefly discussed.

Original language	English
DOIs	https://doi.org/10.1109/EEIS.1989.720151
State	Published - 1 Jan 1989
Event	16th Conference of Electrical and Electronics Engineers in Israel, EEIS 1989 - Tel-Aviv, Israel Duration: 7 Mar 1989 → 9 Mar 1989

Conference

Conference	16th Conference of Electrical and Electronics Engineers in Israel, EEIS 1989
Country/Territory	Israel
City	Tel-Aviv
Period	7/03/89 → 9/03/89

ASJC Scopus subject areas

Software
Computer Networks and Communications
Signal Processing
Electrical and Electronic Engineering
Instrumentation

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10.1109/EEIS.1989.720151

Cite this

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title = "Log likelihood ratio distortion measures for scalar time varying and stationary vector processes",

abstract = "In this paper, two distortion measures, based on the well known statistical Log Likelihood Ratio (LLR) criterion are presented. The first one is developed for non-stationary scalar processes, represented by a Time Varying Autoregressive (TV AR) model and the second for stationary vector processes, represented by a Multichannel Autoregressive (MC AR) model. The asymptotic distribution of the proposed measures is briefly discussed.",

author = "Shallom, {Ilan D.} and Flomen, {Felix A.} and Arnon Cohen",

note = "Publisher Copyright: {\textcopyright} 1990 IEEE.; 16th Conference of Electrical and Electronics Engineers in Israel, EEIS 1989 ; Conference date: 07-03-1989 Through 09-03-1989",

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AU - Flomen, Felix A.

AU - Cohen, Arnon

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N2 - In this paper, two distortion measures, based on the well known statistical Log Likelihood Ratio (LLR) criterion are presented. The first one is developed for non-stationary scalar processes, represented by a Time Varying Autoregressive (TV AR) model and the second for stationary vector processes, represented by a Multichannel Autoregressive (MC AR) model. The asymptotic distribution of the proposed measures is briefly discussed.

AB - In this paper, two distortion measures, based on the well known statistical Log Likelihood Ratio (LLR) criterion are presented. The first one is developed for non-stationary scalar processes, represented by a Time Varying Autoregressive (TV AR) model and the second for stationary vector processes, represented by a Multichannel Autoregressive (MC AR) model. The asymptotic distribution of the proposed measures is briefly discussed.

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DO - 10.1109/EEIS.1989.720151

M3 - Paper

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T2 - 16th Conference of Electrical and Electronics Engineers in Israel, EEIS 1989

Y2 - 7 March 1989 through 9 March 1989

ER -

Log likelihood ratio distortion measures for scalar time varying and stationary vector processes

Abstract

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