Low-frequency noise in AlGaAs/InGaAs/GaAs Hall micromagnetometers

Vincent Mosser, Grzegorz Jung, Jacek Przybytek, Miguel Ocio, Youcef Haddab

Research output: Contribution to journalConference articlepeer-review

15 Scopus citations


We report on studies aimed at understanding and improving the intrinsic noise of high-performance sensors using a 2D electron gas channel confined by a quantum well in the pseudomorphic AlGaAs/InGaAs/GaAs heterostructure. MIS gated and ungated Hall sensors shaped as a Greek cross with dimensions ranging from 100 μm down to submicrometer range have been investigated. At room temperature the predominant low frequency Hall voltage noise originates from the ensemble of trapping/detrapping events occurring within the continuum of GaAs surface states. Its power spectral density can be deduced from independent measurements of the interface trap density-of-states by applying Shockley-Read-Hall Read-Hall dynamics and the Fluctuation-Dissipation Theorem. In fact, theoretical spectra calculated without any adjustable fitting parameter coincide closely with the experimentally measured ones. At cryogenic temperature this interface traps noise freezes out, thus revealing a much weaker intrinsic background noise with 1/f spectrum. For small sensors the intrinsic 1/f noise converts into one or a few lorentzians due to the action of individual random telegraph signals (RTS). For Hall crosses with an intersection of 4×4μm2, we find statistically less than 1 fluctuator per each decade of time constant at 77 K. Due to the random distribution of the elementary fluctuators, some of these small Hall crosses may show less low-frequency noise than much larger 60×60μm2 sensors.

Original languageEnglish
Pages (from-to)183-195
Number of pages13
JournalProceedings of SPIE - The International Society for Optical Engineering
StatePublished - 19 Sep 2003
EventNoise and Information in Nanoelectronics, Sensors, and Standards - Santa Fe, NM, United States
Duration: 2 Jun 20034 Jun 2003


  • 1/f noise
  • Hall effect
  • Hall sensor
  • Heterostructure
  • III-V
  • Interface states
  • LF noise
  • RTS
  • Surface states

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering


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