Measurements of charging-up processes in THGEM-based particle detectors

M. Pitt, P. M.M. Correia, S. Bressler, A. E.C. Coimbra, D. Shaked Renous, C. D.R. Azevedo, J. F.C.A. Veloso, A. Breskin

Research output: Contribution to journalArticlepeer-review

22 Scopus citations

Abstract

The time-dependent gain variation of detectors incorporating Thick Gas Electron Multipliers (THGEM) electrodes was studied in the context of charging-up processes of the electrode's insulating surfaces. An experimental study was performed to examine model-simulation results of the aforementioned phenomena, under various experimental conditions. The results indicate that in a stable detector's environment, the gain stabilization process is mainly affected by the charging-up of the detector's insulating surfaces caused by the avalanche charges. The charging-up is a transient effect, occurring during the detector's initial operation period; it does not affect its long-term operation. The experimental results are consistent with the outcome of model-simulations.

Original languageEnglish
Article numberP03009
JournalJournal of Instrumentation
Volume13
Issue number3
DOIs
StatePublished - 14 Mar 2018
Externally publishedYes

Keywords

  • Detector modelling and simulations II (electric fields, charge transport, multiplication and induction, pulse formation, electron emission, etc)
  • Electron multipliers (gas)
  • Micropattern gaseous detectors (MSGC, GEM, THGEM, RETHGEM, MHSP, MICROPIC, MICROMEGAS, InGrid, etc)

ASJC Scopus subject areas

  • Instrumentation
  • Mathematical Physics

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