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Measuring obsessive-compulsive symptoms: Padua Inventory-Revised vs. Yale-Brown Obsessive Compulsive Scale
Gideon E. Anholt, Patricia van Oppen, Paul M.G. Emmelkamp, Danielle C. Cath, Johannes H. Smit, Richard van Dyck, Anton J.L.M. van Balkom
Research output: Contribution to journal › Article › peer-review
16
Scopus
citations